Burst-Generator SFT 1420 | 2 MHz
IEC / EN 61000-4-4
The test generator SFT 1420 simulates quick transient noise interference as they are defined in the standard IEC / EN 61000-4-4. The single pulses show a very short rise-time (5 ns) and due to this a wide RF-spectrum up to 300 MHz. RF interferences are the result.
Due to the high maximum burst frequency of 2 MHz, up to 2000 individual pulses can be realized in one burst package. The SFT 1420 can test far beyond the standard test levels and also allows very high-energy tests for drive controls, for example.
- Pulse voltage: 100 V to 4800 kV
- Spike frequency: single pulse up to 2000 kHz
- Burst duration: 0.01 ms - 100 ms*
- Burst repetition rate: 10 ms - 1000 ms*
*The SFT 1420 takes the limit parameters into account automatically. - Triggering: manual or external
- HV output: coaxial socket
- Monitor output: BNC, TTL level
- Interface: RS 232
- Internal single-phase coupling network
- Weight: approx. 12 kg
The burst pulse occurring in practice does not comply with the definition. Its physical properties are deviating against the standard definition.
The burst frequency of up to 2000 kHz allows EUTs to be tested far above the standard. As the real burst pulse is located at approx. 1000 kHz, the SFT 1420 can better reproduce the real simulation.
The generator SFT 1420 provides the user a variety of special features such as „Real Burst“ which simulates the natural appearance of the Burst pulse or „Noise“ can be simulated with the contact bounce. The functions "IFM" and "DFM" (increasing or decreasing frequency within a burst packet) are important tools for investigating resonance or saturation effects in the EUT.
The simple operation and the clearly arranged front panel with all possible settings enable time-saving and optimized tests in the areas of research and development, quality assurance and in the accredited laboratory.
All burst parameters can be changed during a burst test. This guarantiees that it can be easily and continuously to detect the fault threshold of the test specimen. An interruption of the test for a parameter change at the burst generator is not necessary.